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News

High Speed Imaging On Show At Photonics West

Specialised Imaging : 12 January, 2011  (Company News)
The Photonics West trade show in San Francisco will be attended by Specialised Imaging demonstrating the companyís ultra high speed imaging systems
Specialised Imaging will be displaying its latest product innovations and applications advances in ultra high-speed imaging at Photonics West in San Francisco, USA (January 22-27th 2011).



Visitors to Booth 4527 at this important meeting will have the opportunity to review the latest revision of the SIM Ultra Fast Framing Camera which is now capable of capturing up to 32 images at 1 billion frames per second (fps).  In addition all SIM series ultra high-speed cameras are now able to undertake Multi-Spectral imaging experiments allowing colour images to be taken at 3ns with interframe times of 1ns.



Unlike traditional ultra fast framing cameras the optical design of SIM cameras provide the choice of up to 16 separate optical channels without comprising performance or image quality. Effects such as parallax and shading, inherent in other designs, are eliminated and the high spatial resolution (> 36 lp/mm) is the same from frame to frame and in both axes.   Individual ultra-high resolution intensified CCD detectors, controlled by state-of-the-art electronics, offer almost infinite control over gain and exposure allowing experimenters researchers total freedom to capture images of even the most difficult transient phenomena.  The ability to mount individual filters on each optical channel provides the SIM with uniquely flexible spectral selectivity.  An integral TFT monitor allows users to 'see what the camera sees' in real-time, thus allowing users to easily optimise focus and lighting to achieve spectacular results.



Also on display will be wide range of new applications data for review and discussion in areas including ballistics, combustion research, failure dynamics, elasticity, crack propagation, hypervelocity impact studies, shock resistance, medical research, detonics, impact studies, spray / particle analysis, PIV and nanotechnology.
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