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News

Fast cooldown time for new generation X-Ray detector

Princeton Gamma Tech : 10 June, 2009  (New Product)
The Sahara III silicon drift detector from Princeton Gamma Tech offers faster cooldown times for improved throughput rates
Princeton Gamma Tech Instruments (PGT) has introduced the Sahara III, a new Silicon Drift Detector (SDD) which delivers exceptionally fast cooldown periods. The reduction in cooldown times allows an improvement in throughput and data collection. The Sahara III, now offers a cooldown period of less than 5 minutes (10mm2 detector module).

Typical SDD detectors available today require a cooldown period up to 1 hour, limiting the data collection phase. For end users who are changing samples frequently, or in a shared vacuum requiring thermal cycling, cooldown times are critical to efficient system operations.

'The advancements in technology are possible because of PGTs compact SDD module size, the coldfinger mass is very low, and an optimized Peltier thermoelectric cooler,' comments Company President Juhani Taskinen. 'Our performance, our price, and the personal services we provide all contribute to the satisfaction our customers enjoy.'

The Sahara III outperforms competition even without the significant cooling requirements typical today. For example, our recent in-house evaluation at an operating temperature of -15°C yielded comparable results to other commercial units operating at -60°C. This further differentiates the new technology from previous SDD options.

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